
12th METROLOGY FOR DIGITAL TRANSFORMATION DAY
Invitation: 12th M4DT-DAY “Measurement information in a Digital World”
Dear colleague,
The Metrology Working Group 14 of the Inter-American Metrology System (SIM-MWG14) periodically organizes an event called M4DT-DAY. It is an event where people interested in digital transformation meet, inviting interested colleagues from the SIM region to a 90-minute day that includes a presentation, discussion, and exchange on M4DT topics. It is a 100% virtual event.
For this M4DT-DAY, the topic will be related to “Measurement information in a Digital World”, on Thursday, February 23rd at 15h00 UTC (please, check your time zone), , according to the following agenda:
TIME (UTC) | ACTIVITY | FACILITATOR |
14h55 | Connecting | James Fedchak NIST |
15h00 | Start of the M4DT Day | |
15h05 | Welcome words and introduction to the day | |
15h10 | Standardizing Digital Calibration and Measurement Capabilities | Mark Kuster NCSL International |
15h40 | Q&A / Exchange Presentation 1 | |
15h50 | The Digital NIST Pilot Project: Transforming and Modelling Digital Reference Material Certificates | Dinis Camara NIST |
16h20 | Q&A / Exchange Presentation 2 | |
16h30 | Closing Words & Comments | James Fedchak NIST |
February 23rd, 2023 – 15h00 to 16h30 UTC (please, check your time zone).
Please share this information with your colleagues interested in this topic.
More information available:
https://www.cenam.mx/m4dt-sim/Events/M4DT-Day-12th-id-85
Registration is required in the following link:
https://www.cenam.mx/m4dt-sim/surveyEvent/m4dt-day/8cIjPf4pEpTgArmTLd103g%3D%3D
We will appreciate your valuable participation.
Best regards
SIM-MWG14 – Follow Up & Support Taskforce